Dissociation of SiH₄ on Si(001) Surface
A key process in the semiconductor manufacturing is the reactive adsorption of molecules such as
silane (SiH4) and dichlorosilane (SiCl2H2) on the surfaces of silicon wafers. This case study
demonstrates the calculation of the geometry of a silane molecule on a reconstructed Si(001)
surface.
The relaxed structure is shown in the right panel of the figure.
The buckling of the Si-surface dimer disappears, when bonds with an –SiH3 group and an –H atom are formed.
The buckling of the neighboring dimer remains unchanged.
Full Version (pdf):
Search
Learn more about ...
- Ab Initio Calculations for Industrial Materials Engineering: Successes and Challenges
- Threefold Increase in the Young’s Modulus of Graphite Negative Electrode during Lithium Intercalation
- A DFT Study of CoMoS and NiMoS Catalysts: from Nano-Crystallite Morphology to Selective Hydrodesulfurization
- Acidity of Amorphous Silica-Alumina: From Coordination Promotion of Lewis Sites to Proton Transfer
- Interfacial oxygen and nitrogen induced dipole formation and vacancy passivation for increased effective work functions in TiN/HfO₂ gate stacks
- Ab initio thermodynamics of oxide surfaces: O₂ on Fe₂O₃ (0001)
- Volume and composition dependence of direct and indirect band gaps in ordered ternary III-V semiconductor compounds: A screened-exchange LDA study
- SrTiO₃ and BaTiO₃ revisited using the projector augmented wave method: Performance of hybrid and semilocal functionals
- Dielectric properties and excitons for extended systems from hybrid functionals
- Computational band-structure engineering of III-V semiconductor alloys
